Aspen Multi-System Corporation offers advance analytical laboratory solutions to its clientele across the Philippine Archipelago. As turn-key provider of laboratory design, fixtures, and furniture, Aspen understands that analytical instruments must produce reliable data to enable scientists, researchers, and engineers to perform their research and product development with confidence, manage and control manufacturing quality, and optimize their output.
Aspen Multi-System Corporation represents various brands that are considered experts in their field. We offer solutions in the following disciplines:
Friction Testers, Wear Testers and Surface Property Analyzers
The Kett Heidon line of friction and wear tesers and surface property analyzers provide unsurpassed performance measurement of friction coefficients (kinetic and static), adhesion, peel strength, tackiness, scratch strength and wear. The flagship 14LFW Multi-Tester allows the user to provide a multitude of different physical characterizations on a single test station, reducing laboratory space […]
Portable Handheld Coating Thickness Gauges
Kett provides a wide array of handheld gauges to measure coating and plating thickness. These systems use eddy current (non-ferrous substrates), magnetic inductance (ferrous substrates) or both principles (dual mode). Simple to use and providing instant measurements, models offer measurement storage, statistical calculations, RS232 data communication and even integrated printers. Our wireless models allow the […]
NIR Composition Analyzer
A Near-Infrared Light Source is reflected off of the liquid or solid sample. The light resonates with the appropriate molecule(s) and a portion of the light is absorbed. The higher the measured component, the higher the amount of absorbed light. After calibration, the composition values can be instantly measured without sample preparation. Multiple organic components […]
Particle Characteristic Diagnosis System
Particle Size Distribution Measurement Detectable Particle Size AU& PT (Guarantee) Measuring Resolution 10nm Operating Pressure 0.03~1 Torr Functions · Monitoring Mode: Real-Time Response for Specific Size · Scanning Mode: Minimum 20 sec for Specific Size Range · Visualization Measurement Magnification x20 to x3000,000 Resolution 3nm (at 30kV SE) Detector SE Detector, BSE Detector Image […]
Easy-to-Use The Best SEM CX-200
Magnification x15 ~ x300,000 (Effective :~ x100,000) Resolution 3.0nm [at 30kV, SE image] Accelerating Voltage 1kV to 30kV Electron Gun Tungsten Filament(w) Detector SE Detector (Optional : BSE,EDS) Stage 4-Axis Manual Stage System x: 40mm，Y: 40mm T: -20˚~90˚, R: 360˚，Z:5 to 60mm(Motorized) Sample Size 55mm (H)，130mm (Diameter) Image Mode(pixel) · RDE (320×240), TV (640×480), […]
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